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[589] Fataicha Y, Cheriet M, Nie J, Suen CY. "Document Analysis : a Multiscale Approach.". In: Proc. The 16th International Conference on Pattern Recognition.; 2002.
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[572] Fataicha Y, Cheriet M, Nie J, Suen CY. "Information Retreival Based on OCR Errors in Scanned Documents.". In: IEEE Conference on Computer Vision and Pattern Recognition Workshop (CVPR). Vol. 3. Wisconsin, USA; 2003:.
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